Spektrodensytometru X-rite

Short Term Repeatability - White Reflectance: 0.1 ∆E94*  (D50,2°, mean of 10 measurements every 3 seconds on white)
Measurement Geometry 45°/0° ring illumination optics, ISO 13655:2009
Inter-Instrument Agreement 0.4 ∆E94* average, 1.0 ∆E94* max. (deviation from X-Rite manufacturing standard at a temperature of 23ºC (73.4ºF) on 12 BCRA tiles (D50, 2º))
Illumination Spot Size 3.5 mm (0.14”)
Light Source Gas filled tungsten (illuminant type A) and UV LED
Measurement Conditions • UV included - ISO 13655:2009 measurement condition M0
• D50 - ISO 13655:2009 measurement condition M1
• UV excluded Filter - ISO 13655:2009 measurement condition M2
Measurement Frequency in Scanning Mode 200 measurements per second
Patch Size Minimal Patch Size in Scanning Mode: 7 x 10 mm (0.28” x 0.39”) (Width x Height) with sensor ruler 10 x 10 mm (0.39” x 0.39”) (Width x Height) without sensor ruler
Photometric Range 10nm; Sampling interval 3.5nm
Spectral Analyzer i1® technology with built-in wavelengths check; Holographic diffraction grating with 128-pixel diode array
Spectral Range 380 - 730 nm
Spectral Reporting 380 ... 730 nm in 10 nm steps
Aperture Measurement aperture: 4.5 mm (0.18”) diameter (effective measurement aperture during scanning is depending on the patch size and measurement speed) 
Calibration

Manual on external ceramic white reference

Measurement Background white, ISO 13655:2009; for measurements on backup board
   

Urządzenia Press Color Control

Prędkość pomiaru 10 cm na sekundę (około 10 sekund dla arkusza B1)
Tryb pracy podczas pomiaru M0 + wybór trybu pomiaru dla wydruku suchego / mokrego.
Mechanizm przesuwu łożyskowany z napędem na pasku zębatym - nie wymaga smarowania
Minimalna szerokość paska kontrolnego 6 mm
Położenie arkusza względem pomiaru regulowane w zakresie 10 - 60 mm od krawędzi arkusza.
Rodzaj i grubość papier do 1 mm
Mierzone kolory zamiennie CMYK / kolory specjalne
Sterowanie dwa przyciski na obudowie lub poprzez komputer